(Institute of Electrical and Electronics Engineers Inc., 1995-10-11) Belenciuc, Alexandr; Fiodorov, Alexandr; Zencenco, Vladimir; Lucaș, Victor; Vasiliev, Alexandr
The dependence of the epitaxial orientations of the films in BaFdSi(III)
heterostructures on growth conditions and the influence of heat treatment on the stability of epitaxial relations in such structures are investigated. The correlations between the types of epitaxial relations and structures of interface are also discussed.
