CHARACTERIZATION OF GEOMETRICALLY FRUSTRATED Zn1−xMnxAl2O4 THIN FILMS PREPARED BY METALORGANIC AEROSOL DEPOSITION

Abstract

We present the results on the structure and magnetoelectric properties of Zn1−xMnxAl2O4 thin films (0 ≤ x ≤ 1), prepared by metalorganic aerosol deposition (MAD) technique. The films have been grown epitaxially on MgO(100) substrates and characterized by X-ray diffraction (XRD), Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray analysis (EDX), magnetization, electron paramagnetic resonance (EPR) and capacitance as a function of temperature and magnetic field. For large x values (x = 0.75 and 1), we observed a deviation of the magnetization from a Curie-Weiss law below 40K, indicating the expected magnetic ordering of the spinel. In the proximity of this magnetic characteristic temperature the capacitance as a function of temperature shows a peak, which infers a multiferroic character of these spinels.