THE COPPER INFLUENCE ON THE PL SPECTRA OF CDTE THIN FILM AS A COMPONENT OF THE CDS/CDTE HETEROJUNCTION
| dc.contributor.author | Vatavu, Sergiu | |
| dc.contributor.author | Zhao, Hehong | |
| dc.contributor.author | Caraman, Iuliana | |
| dc.contributor.author | Gașin, Petru | |
| dc.contributor.author | Ferekides, Chris | |
| dc.date.accessioned | 2021-03-26T10:45:00Z | |
| dc.date.available | 2021-03-26T10:45:00Z | |
| dc.date.issued | 2009 | |
| dc.description.abstract | The influence of annealing in the presence of CdCl2 and a thin copper layer deposited onto CdTe on the photoluminescence spectra of CdTe, as a component of CdS/CdTe heterojunction, has been studied for two excitation wavelengths: 0.337 μm and 0.6328 μm. The behavior of the PL was studied as a function of the measurement temperature and excitation intensity. At 0.6328 μm excitation, the interface PL consists of a known 1.43X band, and the chloride annealing enhances radiative transitions at 1.536 eV. The intensity of the 1.536 eV transitions increases when Cu is present. The PL of as-deposited CdTe films prepared in the presence of oxygen has the 1.45X band attenuated when excited with 0.337 μm excitation wavelength. | en |
| dc.identifier.citation | VATAVU, Sergiu, ZHAO, Hehong, CARAMAN, Iuliana et al. The copper influence on the PL spectra of CdTe thin film as a component of the CdS/CdTe heterojunction. n: Thin Solid Films. 2009, Vol. 517, Issue 7, pp. 2195 -2201. ISSN 0040 - 6090. | en |
| dc.identifier.issn | 0040-6090 | |
| dc.identifier.uri | https://www.sciencedirect.com/science/article/abs/pii/S0040609008013205 | |
| dc.identifier.uri | https://msuir.usm.md/handle/123456789/4010 | |
| dc.language.iso | en | en |
| dc.publisher | Elsevier | en |
| dc.subject | CdS CdTe | en |
| dc.subject | Cu | en |
| dc.subject | heterojunctions | en |
| dc.subject | Photoluminescence (PL) | en |
| dc.title | THE COPPER INFLUENCE ON THE PL SPECTRA OF CDTE THIN FILM AS A COMPONENT OF THE CDS/CDTE HETEROJUNCTION | en |
| dc.type | Article | en |