УВЕЛИЧЕНИЕ КРАТНОСТИ ФОТООТВЕТА В СТРУКТУРАХ АМОРФНЫЕ ПЛЕНКИ As4 Se3 S3 – МЕЛКОДИСПЕРСНЫЙ СЛОЙ НА ОСНОВЕ ВАНАДИЯ И ЕГО ОКИСЛОВ
Date
2009
Journal Title
Journal ISSN
Volume Title
Publisher
CEP USM
Abstract
În lucrare sunt prezentate particularităţile tehnologice de obţinere a structurilor dispersate pe bază de vanadiu, inclusiv având suprafaţa ramificată (fractală). A fost stabilit că la depunerea peliculelor amorfe As4Se3S3 pe suprafeţe fractale, multiplicitatea fotocurentului pentru această strucutură se măreşte.
The technological peculiarities of fine-dyspersated vanadium based structures depositions including the ones with furcated (fractal) surfaces are given in this paper. It has been shown that the deposition of amorphous As4Se3S3 films ontofractal surfaces results in the increase of the photocurrent multiplicity for this structure.
The technological peculiarities of fine-dyspersated vanadium based structures depositions including the ones with furcated (fractal) surfaces are given in this paper. It has been shown that the deposition of amorphous As4Se3S3 films ontofractal surfaces results in the increase of the photocurrent multiplicity for this structure.
Description
Keywords
pelicule amorfe As4 Se3 S3, suprafeţe fractale, structuri dispersate pe bază de vanadiu
Citation
ПРИЛЕПОВ, Владимир; ГАШИН, Петру и др. Увеличение кратности фотоответа в структурах аморфные пленки As4Se3S3 – мелкодисперсный слой на основе ванадия и его окислов. In: Studia Universitatis Moldaviae.Seria Ştiinţe Reale şi ale Naturii: Biologie. Chimie. Revista științifică. 2009, nr. 6(26). pp. 219-221. ISSN 1814-3237.