Facultatea de Fizică şi Inginerie / Faculty of Physics and Engineering
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Item The caracterization of the CdS-based solar cell heterojunctions [Articol](Institute of Electrical and Electronics Engineers Inc., 2010-10-11) Potlog, Tamara; Botnariuc, Vasile; Gorceac, Leonid; Spalatu, Nicolae; Maticiuc, Natalia; Raevschi, SimionThe CdS-based solar cell heterojunctions (HJ) have been obtained by growth of CdS at relatively lower temperature using the close space sublimation method(CSS). Investigation of the photovoltaic characteristics shows an efficiency of about 12 % for InP/CdS and 9.6 % for CdS/CdTe solar cell HJ. The analysis of the forward dark current-voltage and the capacitance-voltage characteristics indicate a tunnelling recombination current which flows through states near or at the interfaces of a thermal energy of about 0.62 eV for CdS/CdTe and 0.42 eV for InP/CdS solar cell heterojunctions. The solar energy conversion efficiency is influenced by the interface states through the open circuit voltage and the fill factor.Item CdS nanometric layers grown on SnO2 coated glass substrates for photovoltaic devices [Articol](2012) Botnariuc, Vasile; Gorceac, Leonid; Coval, Andrei; Chetruș, Petru; Cinic, Boris; Raevschii, Simion; Micli, ValdecCdS layer thickness decreases at high substrate temperatures due to the fact that a part of CdCl2/(NH2)2 CS aqueous solution evaporates without reaching the substrate surface. CdS layers deposited at the substrate temperature from 250oC to 450oC are growing with a deficit of sulfur. CdS layers with better stoichiometry were grown in the conditions when in the solutions, used for CdS layers growing, there is an excess of thiourea (CdCl2/ TU =1:2). The high charge carrier concentration of 1020cm-3 in CdS layers grown on glass substrates coated with SnO2 layer is related to Sn doping of the layers from SnO2 layer.Item Thin AIN films growth on Si (III) by hydride vapor phase epitaxy [Articol](2008) Raevschi, Simion; Davydov, Valerii; Zhilaev, Yurii; Gorceac, Leonid; Botnariuc, VasileThin AlN layers have been grown on Si (111) by hydride vapor phase epitaxy (HVPE) method in a horizontal quartz reactor. The surface of layers has been studied by scanning electron microscopy and by the Raman spectroscopy method and found to have the structured morphology. It has been determined that the layers have high specific electrical resistance and are strained in the plane of the substrate.Item Proprietăţi electrofizice ale straturilor de CdS obţinute prin metoda pulverizării cu tratare termică în hidrogen [Articol](CEP USM, 2012) Botnariuc, Vasile; Gorceac, Leonid; Coval, Andrei; Cinic, Boris; Chetruș, Petru; Raevschi, Semion; Banu, SimionPrin metoda pulverizării chimice au fost crescute straturi de CdS din soluţii apoase de CdCl2/(NH2)2 CS cu molaritatea de 0,1 M în intervalul de temperaturi (250...450)°C. Straturile au fost tratate termic în flux de hidrogen timp de 20 min la temperaturile de 350 şi 450°C. Au fost cercetate proprietăţile electrofizice şi fotoluminescenţa acestor straturi. În straturile depuse la 450°C cu mărirea temperaturii de tratare până la 450°C se observă o uşoară micşorare a concentraţiei purtătorilor de sarcină. Spectrul fotoluminescenţei prezintă o fâşie largă în intervalul de energii 1,6...2,6 eV. Se observă un vârf al fotoluminescenţei cu energia de 1,95 eV, care se deplasează cu mărirea temperaturii de creştere a straturilor de CdS şi atinge valoarea de 2,5 eV pentru straturile crescute la temperatura de 450°C.Item Straturi CdS crescute pe suporturi de sticlă prin metoda pulverizării [Articol](CEP USM, 2012) Botnariuc, Vasile; Gorceac, Leonid; Coval, Andrei; Chetruș, Petru; Cinic, Boris; Raevschi, Simion; Micli, ValdecCdS layers were grown from aqueous solutions of cadmium chlorine (CdCl2) and thyourine (NH2)2 CS with the molarity of 0,1 M by pulverization method in the temperature range of (250...450)°C. CdS layers were grown on glass substrates covered with a previously deposited SnO2 layer. The deposited CdS layers morphology, atomic weight and composition were studied biasing a sunning electron microscope (SEM). The morphology, atomic weight and composition of the deposited CdS layers considerably changes with the increase of the deposition temperature. The charge carriers’ concentration and their mobility in CdS layers deposited at different temperatures were measured and estimated.Item Evoluarea particulelor dispersate de ALN depuse pe si prin metoda HVPE la etapa de formare a stratului continuu [Articol](CEP USM, 2011) Raevschi, Simion; Kompan, Mihail; Zhilyaev, Yurii; Gorceac, Leonid; Botnariuc, VasileEvolution of growth of the disperse particles of AlN which has been grown up on substrates of silicon during formation of a continuous layer are studies by AFM (Atomic Force Microscopy ) method. Layers have been grown up by HVPE (Hydride Vapor Phase Epitaxy) method at 1100o C. It is established: a) nunucleation occurs according to three dimensional model; b) layers are formed of two categories of disperse particles; c) growth rate of categories differ; d) at an initial stage of growth there is a latent period of time when superficial concentration of disperse particles remains to a constant.Item Structura suprafeţei straturilor de AlN depuse pe Si prin metoda HVPE la etapa iniţială de obţinere [Articol](CEP USM, 2010) Raevschi, Simion; Kompan, Mihail; Zhilyaev, Yurii; Gorceac, Leonid; Botnariuc, VasileThe surface structure of AIN layers deposited on the Silicon substrates at the initial stage of germination was studied by the Atomic Force Microscopy (AFM) method. The layers have been deposited by the Hydride Vapor Phase Epitaxy (HVPE) at 1100o C. It was determined that: a) germination follows the 3D model; b) mechanisms of layers growth are changing at the initial deposition stage; c) layers relief can be described in the approximation of a polynomial with elementary Gauss functions as arguments.Item Cercetarea celulelor solare cu heterojoncţiunea nCdS-pInP [Articol](CEP USM, 2009) Gorceac, Leonid; Botnariuc, Vasile; Raevschi, Simion; Coval, Andrei; Chitoroagă, AndreiPhotoelectrical dependencies of nCdS-pInP solar cells, as a function of electro physical parameters, crystallographic orientation of InP substrate and of the deposition duration of the nCdS epitaxial for layer are presented. It was established that the maximum value of the efficiency of solar energy into electrical one is obtained for the holes concentration in the substrate of 2·1016 cm-3, crystallographic orientation (100) and layer growth duration of 25 min. The hetero structure parameters influencing the named dependencies are determined.Item Obţinerea straturilor AIN pe Si prin metoda HVPE şi cercetarea proprietăţilor lor [Articol](CEP USM, 2008) Raevschi, Simion; Davydov, Valerii; Zhilyaev, Yurii; Gorceac, Leonid; Botnariuc, VasileAlN layers on Si(111) were fabricated by Hydride Vapor Phase Eptaxy (HVPE). The obtained layers were studied by using Raman spectroscopy and by scanning electron microscope (SEM). The layers surface is structured. The Raman spectra of the layers, obtained at the temperatures of 800-1100oC, are presented. It was established that the layers are mechanically deformed in substrate plane and have a high value of the threshold voltage (are dielectrics).Item Straturi epitaxiale omogene de CdS obţinute pe InP în hidrogen [Articol](CEP, 2007) Raevschi, Simion; Gorceac, Leonid; Gaugaş, Petru; Botnariuc, VasileEpitaxial layers of the CdS on InP in the open flowing hydrogen system are obtained. Efficiency of zone method growth from a gas phase is shown at deposition of the homogeneous layers of large area.