2. Articole

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Subject: search.filters.subject.ZnS

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    Luminescent properties of ZnS single crystal annealed in the V th group elements melt [Articol]
    (2006) Sobolevscaia, Raisa; Corotcov, Vadim; Bruc, Leonid; Sușchevici, Constantin; Chetruș, Petru
    The influence of ZnS single crystal annealing in the media based on V-group elements Bi and Sb on its photoluminescent (PL) properties was studied. The following media: Bi, Sb, Bi+Zn, Sb+Zn, Bi+S, Sb+As and Bi+Al were used for the annealing.Two types of the starting crystals were used: I) low resistivity ZnS; II) high resistivity ZnS. The annealing was carried out in the vacuumed silica ampoules at the temperatures of 1400 K (I) and 1200 K (II) during 100hrs. The obtained results show that ZnS crystals annealing in Bi and Sb melts leads to the analogical reorganization of radiation centers based on the native and impurity defects generated by interphase interaction at ZnS-melt interface. These defects are responsible for the appearance of the green radiation having the feature of intracentred transitions. The high value of green band half-width indicates that it is a superposition of a few bands. These could be a PL bands related to the oxygen presence, the impurity centers of the V group elements and to V S .
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    Enhanced Responsivity of ZnSe-bazed Metal-Semiconductor-Metal Near-Ultraviolet Photodetector via Impact Ionization [Articol]
    (Willey, 2018) Sirkeli, Vadim; Yilmazoglu, Oktay; Hajo, Ahid S.; Nedeoglo, Natalia; Nedeoglo, Dmitrii; Preu, Sascha; Küppers, Franko; Hartnagel, Hans
    We report on high‐responsivity, fast near‐ultraviolet photodetectors based on bulk ZnSe employing a metal–semiconductor–metal structure with and without interdigital contacts. A very high responsivity of 2.42 and 4.44 A W−1 at 20 V bias voltage and high rejection rate of 7900 and 4810 for the light with a wavelength of 325 nm is obtained for photodetectors without and with interdigital contacts, which indicates an internal gain. The mechanism of internal gain is attributed to the impact ionization of ZnSe atoms under high internal electric field strength of 133 kV cm−1. Also a low dark current of ≈3.4 nA and high detectivity of ≈1.4 × 1011 cm Hz1/2 W−1 at a voltage of 20 V is achieved for the device with interdigital contacts at room temperature.