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Author: search.filters.author.Rotaru, CorneliuSubject: search.filters.subject.GI-XRD

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    Particularități structurale ale filmelor ZnSnN2 [Articol]
    (CEP USM, 2024) Ghilețchii, Gheorghe; Narolschi, Igor; Rotaru, Corneliu; Rusu, Marin; Vatavu, Sergiu
    ZnSnN2 is composed of common non-toxic elements. It exhibits promising optoelectronic properties for application in photoelectric conversion and electromagnetic radiation detection devices. However, the available data on its physical properties are incomplete or contradictory. In this work, we prepare ZnSnN2 thin films and study in detail their structural properties as functi on of deposition conditions. DC magnetron sputtering was used because it allows the preparation of thin polycrystalline ZnSnN2 films on large areas and it can be easily upscaled. The films were prepared using targets of various atomic [Zn]/[Sn] ratios in nitrogen atmosphere at temperatures ranging from 30 to 300°C. Structural analysis, using Grazing Incidence X-ray Diffraction (GI XRD) and X-ray Reflectivity (XRR), revealed the formation of polycrystalline ZnSnN2 films with a wurtzite crystal structure. The obtained structural parameters were found to be influenced by the substrate temperature and elemental concentration in the target. These findings will be used for optimization of the manufacturing process for desired film characteristics.
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    Particularități structurale ale formării nanostraturilor de CdS pe substraturi de ZnO și SnO2 [Articol]
    (CEP USM, 2024) Rotaru, Corneliu
    CdS is a material whose physical properties with optoelectronic applications are influen ced by the preparation technology, especially the type of substrate and its temperatures. CdS thin films were deposited by the CSS method on TCO (AZO, SnO2 )/Glass substrates, varying the substrate temperature between 280-460°C and keeping the evaporation temperature constant at 630°C. Grazing Incidence X-ray Diffraction (GI-XRD) and X-ray Reflectivity (XRR), were used for structural characterizations. The substrate temperature increase (CdS/ZnO:Al/Glass structu re) results in decrease of the microstrain values.