Temperature-dependent growth and XPS of Ag-doped ZnTe thin films deposited by close space sublimation method [Articol]

dc.contributor.authorPotlog, Tamara
dc.contributor.authorDobromir, Marius
dc.contributor.authorDuca, Dumitru
dc.date.accessioned2019-02-27T13:54:31Z
dc.date.available2019-02-27T13:54:31Z
dc.date.issued2015
dc.description.abstractZinc telluride (ZnTe) thin films were sublimated on a glass substrate using closed space sublimation (CSS) technique. The influence of the substrate temperature on the physical properties is studied. The deposited films were immersed in AgNO 3 solution with different concentrations, and then annealed in air. The structure and composition are studied using X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). X-ray diffraction patterns of as-deposited ZnTe thin films exhibited polycrystalline behavior. The preferred orientation of (1 1 1) having cubic phase irrespective of the substrate temperature was observed. The XPS analysis confirmed the presence of Ag in the ZnTe thin films after doping by immersion in the AgNO 3 solution of different concentrations. [ABSTRACT FROM AUTHOR]en
dc.identifier.citationPOTLOG, T., DUCA, D., DOBROMIR, M. Temperature-dependent growth and XPS of Ag-doped ZnTe thin films deposited by close space sublimation method. In: Applied Surface Science. 2015, Vol. 352, p. 33-37. ISSN 0169-4332.en
dc.identifier.issn0169-4332
dc.identifier.urihttps://msuir.usm.md/handle/123456789/1974
dc.language.isoenen
dc.publisherElsevieren
dc.subjectZnTeen
dc.subjectXPSen
dc.subjectXRDen
dc.subjectAg-dopingen
dc.subjectclose space sublimation methoden
dc.subjecttemperature effecten
dc.subjectcristal growthen
dc.subjectsilver analysisen
dc.subjectdoping agents (Chemistry)en
dc.titleTemperature-dependent growth and XPS of Ag-doped ZnTe thin films deposited by close space sublimation method [Articol]en
dc.typeArticleen

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