Crystallinity and optical properties of β-Ga2O3/Ga2S3 layered structure obtained by thermal annealing of Ga2S3 semiconductor [Articol]

dc.contributor.authorSprincean, Veaceslav
dc.contributor.authorLupan, Oleg
dc.contributor.authorCaraman, Iuliana
dc.contributor.authorUntila, Dumitru
dc.contributor.authorPostica, Vasile
dc.contributor.authorCojocaru, Ala
dc.contributor.authorGapeeva, Anna
dc.contributor.authorPalachi, Leonid
dc.contributor.authorAdeling, Rainer
dc.contributor.authorTiginyanu, Ion
dc.contributor.authorCaraman, Mihail
dc.date.accessioned2024-09-13T14:13:41Z
dc.date.available2024-09-13T14:13:41Z
dc.date.issued2021
dc.descriptionSPRINCEAN, Veaceslav; Oleg LUPAN; Iuliana CARAMAN; Dumitru UNTILA; Vasile POSTICA; Ala COJOCARU; Anna GAPEEVA; Leonid PALACHI; Rainer ADELUNG; Ion TIGINYANU și Mihail CARAMAN. Crystallinity and optical properties of β-Ga2O3/Ga2S3 layered structure obtained by thermal annealing of Ga2S3 semiconductor. Materials Science in Semiconductor Processing, 2021. vol. 121, pp. 1-9. ISSN 1369-8001.
dc.description.abstractIn this work, the β-Ga2O3 nanostructures were obtained by thermal annealing in air of β-Ga2S3 single crystals at relatively high temperatures of 970 K, 1070 K and 1170 K for 6 h. The structural, morphological, chemical and optical properties of β-Ga2O3–β-Ga2S3 layered composites grown at different temperatures were investigated by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDX) as well as photoluminescence spectroscopy (PL) and Raman spectroscopy. The results show that the properties of obtained β-Ga2O3–β-Ga2S3 composites were strongly influenced by the thermal annealing tem- perature. The XRD and Raman analyses confirmed the high crystalline quality of the formed β-Ga2O3 nano- structures. The absorption edge of the oxide is due to direct optical transitions. The optical bandwidth was estimated to be approximately 4.34-4.41 eV, depending on the annealing temperature. Annealing of the β-Ga2S3 monocrystals at a higher temperature of 1170 K showed the complete conversion of the surface to β-Ga2O3. These results demonstrate the possibility to grow high quality β-Ga2O3–β-Ga2S3 layered composites and β-Ga2O3 nanostructures in large quantities for various applications such as gas sensing, non-toxic biomedical imaging, nonlinear optical, as well as power device applications. Micro and nanocrystallites present on the surface of the Ga2O3 layer contribute to a diffusion of the incident light which leads to an increase of the absorption rate allowing thus to reduce the thickness of the Ga2O3 layer, in which the generation of unbalanced charge carriers takes place. By decreasing the Ga2O3 layer thickness in such layered composites, the efficiency of photovoltaic cells based on such junctions can be increased.en
dc.description.sponsorshipThis work was financially supported by Moldova State University through the Institutional Grant No. 15.817.02.34A, the Estonian Min- istry of Education and Research (IUT19-4), as well as the European Regional Development Fund [project TK141: Centre of Excellence ‘Advanced materials and high-technology devices for sustainable ener- getics, sensorics and nano-electronics’ (1.01.2015–1.03.2023)]. Dr. Lupan acknowledges the Alexander von Humboldt Foundation for the research fellowship for experienced researchers (3-3MOL/1148833 STP) at the Institute for Materials Science, Kiel University, Germany. Katrin Brandenburg is acknowledged for her help in the final proof- reading of the manuscript. This work was partially supported by the European Commission under the Grant #810652 “NanoMedTwin. This work was partially supported by the Technical University of Moldova and through the ANCD-NARD Grant No. 20.80009.5007.09 at TUM.en
dc.identifier.citationSPRINCEAN, Veaceslav; Oleg LUPAN; Iuliana CARAMAN; Dumitru UNTILA; Vasile POSTICA; Ala COJOCARU; Anna GAPEEVA; Leonid PALACHI; Rainer ADELUNG; Ion TIGINYANU și Mihail CARAMAN. Crystallinity and optical properties of β-Ga2O3/Ga2S3 layered structure obtained by thermal annealing of Ga2S3 semiconductor. Materials Science in Semiconductor Processing, 2021. vol. 121, pp. 1-9. ISSN 1369-8001.en
dc.identifier.issn1369-8001
dc.identifier.urihttps://msuir.usm.md/handle/123456789/16037
dc.identifier.urihttps://doi.org/10.1016/j.mssp.2020.105314
dc.language.isoenen
dc.subjectGallium oxide β-Ga2O3/Ga2S3en
dc.subjectCrystalline β-Ga2S3en
dc.subjectSemiconductoren
dc.subjectScanning electron microscopyen
dc.titleCrystallinity and optical properties of β-Ga2O3/Ga2S3 layered structure obtained by thermal annealing of Ga2S3 semiconductor [Articol]en
dc.typeArticleen

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