Analiza structurală prin difracţie de raze X şi studiul proprietăţilor optice ale straturilor subţiri de ZnTe [Articol]
| dc.contributor.author | Mîrzac, Alexandra | |
| dc.date.accessioned | 2022-06-20T13:33:00Z | |
| dc.date.available | 2022-06-20T13:33:00Z | |
| dc.date.issued | 2013 | |
| dc.description.abstract | Structural and optical properties of ZnTe thin films fabricated by close space sublimation method with different thicknesses are investigated. It was evidenced a relatively small variation of the lattice parameter with increasing the thickness of the layers, starting from the value of 6.1052 Å (0.83 μm) to 6.1047 Å (2.59 μm). With the varying of the thickness the value of the band gap is changed from 2.237 eV up to 2. 243 eV. The photovoltaic devices ZnSe/ZnTe with efficiency of 1.69 % was obtained. | en |
| dc.identifier.citation | MÎRZAC, Alexandra. Analiza structurală prin difracţie de raze X şi studiul proprietăţilor optice ale straturilor subţiri de ZnTe. In: Analele Ştiinţifice ale Universităţii de Stat din Moldova. Științe ale naturii și exacte. CEP USM, 2013, pp. 81-84. ISBN 978-9975-71-420-4. | en |
| dc.identifier.isbn | 978-9975-71-420-4 | |
| dc.identifier.uri | https://msuir.usm.md/handle/123456789/6540 | |
| dc.language.iso | ro | en |
| dc.publisher | CEP USM | en |
| dc.subject | straturi subțiri | en |
| dc.title | Analiza structurală prin difracţie de raze X şi studiul proprietăţilor optice ale straturilor subţiri de ZnTe [Articol] | en |
| dc.type | Article | en |