The effect of Cu and annealing treatments on CdS/CdTe heterostructures studied with QE and photocurrent relaxation techniques [Articol]
| dc.contributor.author | Zhao, H. | |
| dc.contributor.author | Vatavu, Sergiu | |
| dc.contributor.author | Caraman, Iu. M. | |
| dc.contributor.author | Gasin, P. A. | |
| dc.contributor.author | Morel, D. L. | |
| dc.contributor.author | Ferekides, C. S. | |
| dc.date.accessioned | 2021-02-24T09:56:12Z | |
| dc.date.available | 2021-02-24T09:56:12Z | |
| dc.date.issued | 2008 | |
| dc.description.abstract | The photo-emf (photocurrent) decay al light impulses excitation (in longitudinal configuration) has been used to determine the lifetime of the non-equilibrium charge carriers recombining in different regions of the CdS/CdTe Cu containing heterojunction at different temperatures and biases. The photosensitivity spectral distributions have been investigated for samples with different technological variations. | en |
| dc.identifier.citation | H. Zhao, S. A. Vatavu, I. M. Caraman, P. A. Gasin, D. L. Morel and C. S. Ferekides, "The effect of Cu and annealing treatments on CdS/CdTe heterostructures studied with QE and photocurrent relaxation techniques," 2008 33rd IEEE Photovoltaic Specialists Conference, San Diego, CA, USA, 2008, pp. 1-5, doi: 10.1109/PVSC.2008.4922556. | en |
| dc.identifier.uri | https://ieeexplore.ieee.org/document/4922556 | |
| dc.identifier.uri | https://msuir.usm.md/handle/123456789/3847 | |
| dc.language.iso | en | en |
| dc.publisher | IEEE | en |
| dc.subject | heterojunctions | en |
| dc.subject | electric vehicles | en |
| dc.title | The effect of Cu and annealing treatments on CdS/CdTe heterostructures studied with QE and photocurrent relaxation techniques [Articol] | en |
| dc.type | Article | en |