THE ELECTRICAL TRANSPORT MECHANISM IN THE (nCdS–рAs 2Se3 ) HETEROJUNCTIONS

dc.contributor.authorGoglidze, Tatiana
dc.contributor.authorDementiev, Igor
dc.contributor.authorDmitriev, Serghei
dc.contributor.authorNasedchina, Nadejda
dc.contributor.authorMațcova, Natalia
dc.date.accessioned2024-10-02T10:21:27Z
dc.date.available2024-10-02T10:21:27Z
dc.date.issued2008
dc.description.abstractIn the given paper we present results of I-V characterization of thin film heterojunctions on the basis of (nCdS)–(рAs 2 Se3 ). Structures have been obtained via spray pyrolysis deposition of polycrystalline nCdS layers on glass substrate and consecutive thermal vacuum deposition of the amorphous рAs 2 Se3 layers. The possible mechanisms of the current passing through obtained structure are discussed on the basis of results of I-V measurements performed at the different polarities and electrical field intensities in the heterojunction. en
dc.identifier.citationGOGLIDZE, Tatiana; Igor DEMENTIEV; Serghei DMITRIEV; Nadejda NASEDCHINA și Natalia MAȚCOVA. The electrical transport mechanism in the (nCdS–рAs2Se3) heterojunctions . Moldavian Journal of the Physical Sciences. 2008, nr. 4(7), pp. 471-475. ISSN 1810-648X.en
dc.identifier.issn1810-648X
dc.identifier.urihttps://msuir.usm.md/handle/123456789/16222
dc.language.isoenen
dc.titleTHE ELECTRICAL TRANSPORT MECHANISM IN THE (nCdS–рAs 2Se3 ) HETEROJUNCTIONSen
dc.typeArticleen

Files

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
The electrical transport mechanism.pdf
Size:
201.16 KB
Format:
Adobe Portable Document Format
Description:

License bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed upon to submission
Description:

Collections