Facultatea de Fizică şi Inginerie / Faculty of Physics and Engineering

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Author: search.filters.author.Cuculescu, ElmiraSubject: search.filters.subject.Thin films

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    Absorption spectra and extrinsic photoconductivity of Cu and Cd doped GaSe single - Crystal films [Articol]
    (2006) Cuculescu, Elmira; Evtodiev, Igor; Caraman, Mihail; Rusu, George G.
    GaSe single crystal films were doped during growth process with Cu or Cd atoms with concentration ranged between 0.05 and 0.50 at. %. Single crystal films (with thickness about 0.5 μm) were obtained by mechanical splitting of bulk single crystals. Impurity concentration was determined using atomic emission spectroscopy. Spectral dependences of absorption coefficient and photoconductivity were studied in the range 1.50 eV – 3.70 eV. It was experimentally established that the absorption spectra have an additional absorption band and its corresponding energy depends on the nature (Cu or Cd) and concentration of the doping atoms. Also, independently on the presence of the dopant, other two absorption bands in the IR region are present.
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    Study of generation-recombination processes of non-equilibrium charge carriers in single crystalline thin GaSe(Cu) films [Articol]
    (2006) Cuculescu, Elmira; Evtodiev, Igor; Caraman, Mihail; Leontie, Liviu
    The generation-recombination processes of non-equilibrium charge carriers in undoped and Cu-doped (in the range 0.1-0.5 at.%.) single crystalline GaSe films with thickness d in the range 1.5-225 μm are investigated. Cu doping of GaSe crystals up to 0.5 at.% leads to an increase of electrical conductivity by over 4 orders of magnitude, as well to enhancement of impurity luminescence band (PL) and extension of photoconductivity spectral range. By studying PL and photonductivity spectra, for different excitation (photon) energies in temperature range (78-420) K, energies of localized states due to both Cu and accidental impurities are determined. By analysing temperature dependence of electrical conductivity and photoconductivity for undoped and Cu-doped films, the activation energy of acceptor levels in doped films was determined as 0.058 and 0.025 eV. Increasing Cu doping from 0.1 to 0.5 at.%. results in decreasing energy of acceptor levels up to ∼0.02 eV. By analysing the impurity absorption and photoconduction at 78 K the energy of acceptor levels was determined as 12-15 meV greater than previously evaluated, depending on Cu concentration. For films with d<5 μm, the surface states concentration increased for Cu doping over 0.3 at.%.